APA citiranje

Douglas, J., & Moody, M. (2017). Atom probe tomography analysis of near surface, low concentration impurities in single crystal silicon.

Chicago Style (17th ed.) Citation

Douglas, J., and M. Moody. Atom Probe Tomography Analysis of Near Surface, Low Concentration Impurities in Single Crystal Silicon. 2017.

MLA citiranje

Douglas, J., and M. Moody. Atom Probe Tomography Analysis of Near Surface, Low Concentration Impurities in Single Crystal Silicon. 2017.