Charge collection studies in irradiated HV-CMOS particle detectors

Charge collection studies in irradiated HV-CMOS particle detectors

Charge collection properties of particle detectors made in HV-CMOS technology were investigated before and after irradiation with reactor neutrons. Two different sensor types were designed and processed in 180 and 350 nm technology by AMS. Edge-TCT and charge collection measurements with electrons f...

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Bibliographic Details
Main Authors: Affolder, A, Andelković, M, Arndt, K, Bates, R, Blue, A, Bortoletto, D, Buttar, C, Caragiulo, P, Cindro, V, Das, D, Dopke, J, Dragone, A, Ehrler, F, Fadeyev, V, Galloway, Z, Gorišek, A, Grabas, H, Gregor, IM, Grenier, P, Grillo, A, Hommels, LBA, Huffman, T, Phillips, P, Kanisauskas, K, Plackett, R, Shipsey, I, Vigani, L, John, J, McMahon, S, Nickerson, R, Kenney, C, Kramberger, G, Liang, Z, Mandić, I, Maneuski, D, Mikuž, M, Muenstermann, D, Perić, I, Rubbo, F, Segal, J, Seiden, A, Song, W, Stanitzki, M, Su, D, Tamma, C, Turchetta, R, Volk, J, Wang, R, Warren, M, Wilson, F, Worm, S, Xiu, Q, Zavrtanik, M, Zhang, J, Zhu, H
Format: Journal article
Language:English
Published: IOP Publishing 2016

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