Microwave surface resistance measurements of air-atomised spray deposited Tl-Ba-Ca-Cu-O thick films
The surface resistance (Rs) of spray pyrolysed Tl2Ba2Ca2Cu3Ox thick films on 1 inch diameter finely polished yttria-stabilized zirconia disks has been measured using a TE011 mode end-wall-replacement cavity at 20 GHz and 77 K. Rs values of 5.3 mΩ and 1.3 mΩ at 20 GHz and 10 GHz (scaled assuming an f...
Үндсэн зохиолчид: | Jenkins, A, Su, L, Kale, K, Goringe, M, Burgoyne, J, Dew-Hughes, D, Grovenor, C |
---|---|
Формат: | Journal article |
Хэл сонгох: | English |
Хэвлэсэн: |
IEEE
1995
|
Ижил төстэй зүйлс
Ижил төстэй зүйлс
-
MICROWAVE SURFACE-RESISTANCE MEASUREMENTS OF AIR-ATOMIZED SPRAY DEPOSITED TL-BA-CA-CU-O THICK-FILMS
-н: Jenkins, A, зэрэг
Хэвлэсэн: (1995) -
Tl-Ba-Ca-Cu-O thin films on buffered substrates for microwave device applications
-н: Bramley, A, зэрэг
Хэвлэсэн: (1997) -
Microstructural and microwave characterisation of low temperature processed Tl2Ba2Ca1Cu2Ox thin films
-н: OConnor, J, зэрэг
Хэвлэсэн: (1997) -
The processing at low temperatures of Tl2Ba2Ca1Cu2Ox films in argon atmospheres for microwave devices
-н: OConnor, J, зэрэг
Хэвлэсэн: (1995) -
The microstructure and electrical properties of Tl2Ba2Ca1Cu2Ox thin films processed at low temperatures
-н: O'Connor, J, зэрэг
Хэвлэсэн: (1998)