Strain relaxation by alloying effects in Ge islands grown on Si(001)

Míreanna comhchosúla

• Extracting composition and alloying information of coherent Ge(Si)/Si(001) islands from [001] on-zone bright-field diffraction contrast images
  de réir: Liao, X, et al.
  Foilsithe / Cruthaithe: (2001)
• Alloying and Strain Relaxation in SiGe Islands Grown on Pit-Patterned Si(001) Substrates Probed by Nanotomography
  de réir: Merdzhanova T, et al.
  Foilsithe / Cruthaithe: (2009-01-01)
• [001] zone-axis bright-field diffraction contrast from coherent Ge(Si) islands on Si(001).
  de réir: Liao, X, et al.
  Foilsithe / Cruthaithe: (2004)
• Alternative mechanism for misfit dislocation generation during high-temperature Ge(Si)/Si(001) island growth
  de réir: Zou, J, et al.
  Foilsithe / Cruthaithe: (2002)
• Alloying, elemental enrichment, and interdiffusion during the growth of Ge(Si)/Si(001) quantum dots
  de réir: Liao, X, et al.
  Foilsithe / Cruthaithe: (2002)