Polycrystalline silicon field emitters

Field emission of electrons from polycrystalline silicon micropoint emitters has been investigated. Two process routes, wet and dry etching, were used to form emitters, and their morphologies were compared using a transmission electron microscope (TEM). TEM micrographs of the wet-etched polysilicon...

תיאור מלא

מידע ביבליוגרפי
Main Authors: Boswell, E, Huq, SE, Huang, M, Prewett, P, Wilshaw, P
פורמט: Conference item
יצא לאור: 1996
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