Microstrain distributions in polycrystalline thin film measured by X-ray microdiffraction
Microstrain distributions were acquired in functional thin films by high resolution X-ray microdiffraction measurements, using a polycrystalline CuInSe2 thin film as model system. This technique not only provides spatial resolutions at the submicrometer scale but also allows for analysis of thin fil...
| Main Authors: | , , , , , , |
|---|---|
| Format: | Journal article |
| Published: |
International Union of Crystallography
2016
|