The brittle-ductile transition in silicon. II. interpretation
<p>A dynamic crack tip shielding model has been developed to describe the brittle-ductile transition (BDT) of precracked crystals in constant strain-rate tests. Dislocations are emitted from a discrete number of sources at or near the crack tip. At the BDT the dislocations are anddollar; emitt...
| Päätekijät: | , , |
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| Aineistotyyppi: | Journal article |
| Julkaistu: |
Royal Society
1989
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