The brittle-ductile transition in silicon. II. interpretation

<p>A dynamic crack tip shielding model has been developed to describe the brittle-ductile transition (BDT) of precracked crystals in constant strain-rate tests. Dislocations are emitted from a discrete number of sources at or near the crack tip. At the BDT the dislocations are anddollar; emitt...

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Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς: Hirsch, P, Roberts, S, Samuels, J
Μορφή: Journal article
Έκδοση: Royal Society 1989

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