The brittle-ductile transition in silicon. II. interpretation
<p>A dynamic crack tip shielding model has been developed to describe the brittle-ductile transition (BDT) of precracked crystals in constant strain-rate tests. Dislocations are emitted from a discrete number of sources at or near the crack tip. At the BDT the dislocations are anddollar; emitt...
Κύριοι συγγραφείς: | Hirsch, P, Roberts, S, Samuels, J |
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Μορφή: | Journal article |
Έκδοση: |
Royal Society
1989
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Παρόμοια τεκμήρια
Παρόμοια τεκμήρια
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THE BRITTLE-TO-DUCTILE TRANSITION IN SILICON
ανά: Samuels, J, κ.ά.
Έκδοση: (1988) -
BRITTLE TO DUCTILE TRANSITION IN SILICON.
ανά: Samuels, J, κ.ά.
Έκδοση: (1986) -
THE BRITTLE DUCTILE TRANSITION IN SILICON
ανά: Hirsch, P, κ.ά.
Έκδοση: (1991) -
DISLOCATION DYNAMICS AND THE BRITTLE DUCTILE TRANSITION IN PRECRACKED SILICON
ανά: Hirsch, P, κ.ά.
Έκδοση: (1989) -
DISLOCATION DYNAMICS AND THE BRITTLE DUCTILE TRANSITION IN PRECRACKED SILICON
ανά: Hirsch, P, κ.ά.
Έκδοση: (1989)