The brittle-ductile transition in silicon. II. interpretation
<p>A dynamic crack tip shielding model has been developed to describe the brittle-ductile transition (BDT) of precracked crystals in constant strain-rate tests. Dislocations are emitted from a discrete number of sources at or near the crack tip. At the BDT the dislocations are anddollar; emitt...
Päätekijät: | Hirsch, P, Roberts, S, Samuels, J |
---|---|
Aineistotyyppi: | Journal article |
Julkaistu: |
Royal Society
1989
|
Samankaltaisia teoksia
-
THE BRITTLE-TO-DUCTILE TRANSITION IN SILICON
Tekijä: Samuels, J, et al.
Julkaistu: (1988) -
BRITTLE TO DUCTILE TRANSITION IN SILICON.
Tekijä: Samuels, J, et al.
Julkaistu: (1986) -
THE BRITTLE DUCTILE TRANSITION IN SILICON
Tekijä: Hirsch, P, et al.
Julkaistu: (1991) -
DISLOCATION DYNAMICS AND THE BRITTLE DUCTILE TRANSITION IN PRECRACKED SILICON
Tekijä: Hirsch, P, et al.
Julkaistu: (1989) -
DISLOCATION DYNAMICS AND THE BRITTLE DUCTILE TRANSITION IN PRECRACKED SILICON
Tekijä: Hirsch, P, et al.
Julkaistu: (1989)