DISLOCATION RECOMBINATION THEORY FOR SILICON AND INTERPRETATION OF EBIC CONTRAST IN TERMS OF FUNDAMENTAL DISLOCATION PARAMETERS.

A new theory is proposed for recombination at charged dislocations in semiconductors. This is applied to EBIC contrast from individual dislocations.

Bibliographic Details
Main Authors: Wilshaw, P, Booker, G
Format: Journal article
Language:English
Published: 1986