Ionic structure, liquid-liquid phase transitions, x-ray diffraction, and x-ray Thomson scattering in shock-compressed liquid silicon in the 100-200 GPa regime
Recent cutting-edge experiments have provided in situ structure characterization and measurements of the pressure (P), density (¯ρ) and temperature (T) of shock compressed silicon in the 100 GPa range of pressures and up to ∼10,000K. We present first-principles calculations in this P, T, ρ¯ regime t...
| Main Authors: | , , , |
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| Format: | Journal article |
| Language: | English |
| Published: |
American Physical Society
2025
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