Characterisation of Defects at Non-Polar GaN/InGaN Junctions in Novel Materials for Application in Light Emitting Diodes

Despite the significant progress in the area, III-nitride LEDs still suffer from reduced efficiency due to a high dislocation density associated with a lack of suitable growth substrates and strong polarisation fields along the c-axis, the predominant growth direction, resulting in the quantum confi...

Volledige beschrijving

Bibliografische gegevens
Hoofdauteurs: Severs, J, Lozano, J, Hooper, S, Nellist, P
Formaat: Conference item
Gepubliceerd in: Institute of Physics Publishing 2014