On the locking of dislocations by oxygen in silicon
Locking of dislocations by oxygen atoms in Czochralski silicon has been investigated both experimentally and theoretically. Experiments were performed at annealing temperatures between 700 and 850°C for different annealing times and different oxygen concentrations. These showed five distinct regimes...
المؤلفون الرئيسيون: | Senkader, S, Jurkschat, K, Gambaro, D, Falster, R, Wilshaw, P |
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التنسيق: | Journal article |
اللغة: | English |
منشور في: |
2001
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مواد مشابهة
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Locking of dislocations by oxygen in Cz-silicon
حسب: Senkader, S, وآخرون
منشور في: (1999) -
Oxygen-dislocation interactions in silicon at temperatures below 700 degrees C: Dislocation locking and oxygen diffusion
حسب: Senkader, S, وآخرون
منشور في: (2001) -
The segregation behaviour of oxygen at dislocations in silicon
حسب: Senkader, S, وآخرون
منشور في: (1999) -
Dislocation locking in silicon by oxygen and oxygen transport at low temperatures
حسب: Senkader, S, وآخرون
منشور في: (2004) -
Oxygen transport in Czochralski silicon investigated by dislocation locking experiments
حسب: Murphy, J, وآخرون
منشور في: (2006)