Interpreting atom probe data from oxide-metal interfaces
Understanding oxide-metal interfaces is crucial to the advancement of materials and components for many industries, most notably for semiconductor devices and power generation. Atom probe tomography provides three-dimensional, atomic scale information about chemical composition, making it an excelle...
| Main Authors: | , , , , |
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| Format: | Journal article |
| Language: | English |
| Published: |
Cambridge University Press
2018
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