Band offsets at the Si/SiO2 interface from many-body perturbation theory.

We use many-body perturbation theory, the state-of-the-art method for band-gap calculations, to compute the band offsets at the Si/SiO2 interface. We examine the adequacy of the usual approximations in this context. We show that (i) the separate treatment of band structure and potential lineup contr...

全面介紹

書目詳細資料
Main Authors: Shaltaf, R, Rignanese, G, Gonze, X, Giustino, F, Pasquarello, A
格式: Journal article
語言:English
出版: 2008

相似書籍