An SEM EBIC study of the electronic properties of dislocations in silicon

An SEM EBIC study of the electronic properties of dislocations in silicon

<p>Individual, well structurally characterised dislocations present in n-type silicon have been studied using the electron beam induced current (EBIC) mode of an SEM.</p>An EBIC system has been designed and constructed which includes i) phase sensitive detection, ii) computerised contro...

Bibliográfalaš dieđut
Váldodahkkit:	Wilshaw, P, Wilshaw, Peter
Eará dahkkit:	Ourmazd, A
Materiálatiipa:	Oahppočájánas
Giella:	English
Almmustuhtton:	1984
Fáttát:	Dislocations in metals Defects Silicon Scanning electron microscopy

Geahča maid

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