Image Contrast in Aberration-Corrected Scanning Confocal Electron Microscopy
The mechanism of image contrast formation in aberration-corrected scanning confocal electron microscopy (SCEM) is studied. Studies of image formation mechanism in high-resolution SCEM have been based on the application of a linear imaging theory from confocal optical microscopy, the wave function fo...
| Main Authors: | , , , , , , , |
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| פורמט: | Journal article |
| שפה: | English |
| יצא לאור: |
2010
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