Skip to content
VuFind
English
Deutsch
Español
Français
Italiano
日本語
Nederlands
Português
Português (Brasil)
中文(简体)
中文（繁體）
Türkçe
עברית
Gaeilge
Cymraeg
Ελληνικά
Català
Euskara
Русский
Čeština
Suomi
Svenska
polski
Dansk
slovenščina
اللغة العربية
বাংলা
Galego
Tiếng Việt
Hrvatski
हिंदी
Հայերէն
Українська
Sámegiella
Монгол
Language
All Fields
Title
Author
Subject
Call Number
ISBN/ISSN
Tag
Find
Advanced
Force dependent metalloprotein...
Cite this
Text this
Email this
Print
Export Record
Export to RefWorks
Export to EndNoteWeb
Export to EndNote
Permanent link
Export Ready —
Force dependent metalloprotein conductance by conducting atomic force microscopy
Bibliographic Details
Main Authors:
Zhao, J
,
Davis, J
Format:
Journal article
Published:
2003
Holdings
Description
Similar Items
Staff View
Similar Items
Molecular electron transfer of protein junctions characterised by conducting atomic force microscopy.
by: Zhao, J, et al.
Published: (2005)
Exploring the electronic and mechanical properties of protein using conducting atomic force microscopy.
by: Zhao, J, et al.
Published: (2004)
The tunnelling conductance of molecularly ordered metalloprotein arrays.
by: Davis, J, et al.
Published: (2004)
Stripe noise removal in conductive atomic force microscopy
by: Mian Li, et al.
Published: (2024-02-01)
Conductive-probe atomic force microscopy characterization of silicon nanowire
by: Yu Linwei, et al.
Published: (2011-01-01)