Howard Flack and the Flack Parameter
The Flack Parameter is now almost universally reported for all chiral materials characterized by X-ray crystallography. Its elegant simplicity was an inspired development by Howard Flack, and although the original algorithm for its computation has been strengthened by other workers, it remains an es...
| المؤلفون الرئيسيون: | , |
|---|---|
| التنسيق: | Journal article |
| اللغة: | English |
| منشور في: |
MDPI
2020
|