Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction
Advanced structural characterisation techniques which are rapid to use, non-destructive and structurally definitive on the nanoscale are in demand, especially for a detailed understanding of extended-defects and their influence on the properties of materials. We have applied the electron backscatter...
| Główni autorzy: | , , , , , , , , |
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| Format: | Journal article |
| Język: | English |
| Wydane: |
Springer Nature
2017
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