Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction
Advanced structural characterisation techniques which are rapid to use, non-destructive and structurally definitive on the nanoscale are in demand, especially for a detailed understanding of extended-defects and their influence on the properties of materials. We have applied the electron backscatter...
| Main Authors: | , , , , , , , , |
|---|---|
| 格式: | Journal article |
| 语言: | English |
| 出版: |
Springer Nature
2017
|