Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting.

Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting.

Quantitative annular dark field scanning transmission electron microscopy (ADF STEM) has become a powerful technique to characterise nano-particles on an atomic scale. Because of their limited size and beam sensitivity, the atomic structure of such particles may become extremely challenging to deter...

Bibliografske podrobnosti
Main Authors:	De Backer, A, Martinez, G, MacArthur, K, Jones, L, Béché, A, Nellist, P, Van Aert, S
Format:	Journal article
Jezik:	English
Izdano:	Elsevier 2015

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