Low-voltage SEM of air-sensitive powders: From sample preparation to micro/nano analysis with secondary electron hyperspectral imaging

Powder materials are used in all corners of materials science, from additive manufacturing to energy storage. Scanning electron microscopy (SEM) has developed to meet morphological, microstructural and bulk chemical powder characterization requirements. These include nanoscale elemental analysis and...

詳細記述

書誌詳細
主要な著者: Nohl, JF, Farr, NTH, Sun, Y, Hughes, GM, Cussen, SA, Rodenburg, C
フォーマット: Journal article
言語:English
出版事項: Elsevier 2022

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