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X-ray diffraction contrast to...
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X-ray diffraction contrast tomography: a novel technique for three-dimensional grain mapping of polycrystals. I. Direct beam case
Manylion Llyfryddiaeth
Prif Awduron:
Ludwig, W
,
Schmidt, S
,
Lauridsen, E
,
Poulsen, H
Fformat:
Conference item
Cyhoeddwyd:
2008
Daliadau
Disgrifiad
Eitemau Tebyg
Dangos Staff
Eitemau Tebyg
X-ray diffraction contrast tomography: a novel technique for three-dimensional grain mapping of polycrystals. II. The combined case
gan: Johnson, G, et al.
Cyhoeddwyd: (2008)
Three-dimensional x-ray diffraction microscopy : mapping polycrystals and their dynamics /
gan: 193559 Poulsen, Henning F.
Cyhoeddwyd: (2004)
Three-dimensional grain mapping by x-ray diffraction contrast tomography and the use of Friedel pairs in diffraction data analysis.
gan: Ludwig, W, et al.
Cyhoeddwyd: (2009)
X-ray coherent diffraction imaging with an objective lens: Towards three-dimensional mapping of thick polycrystals
gan: A. F. Pedersen, et al.
Cyhoeddwyd: (2020-07-01)
Non-destructive analysis of micro texture and grain boundary character from X-ray diffraction contrast tomography
gan: King, A, et al.
Cyhoeddwyd: (2010)