X-ray diffraction contrast tomography: a novel technique for three-dimensional grain mapping of polycrystals. I. Direct beam case

פריטים דומים

• X-ray diffraction contrast tomography: a novel technique for three-dimensional grain mapping of polycrystals. II. The combined case
  מאת: Johnson, G, et al.
  יצא לאור: (2008)
• Three-dimensional x-ray diffraction microscopy : mapping polycrystals and their dynamics /
  מאת: 193559 Poulsen, Henning F.
  יצא לאור: (2004)
• Three-dimensional grain mapping by x-ray diffraction contrast tomography and the use of Friedel pairs in diffraction data analysis.
  מאת: Ludwig, W, et al.
  יצא לאור: (2009)
• X-ray coherent diffraction imaging with an objective lens: Towards three-dimensional mapping of thick polycrystals
  מאת: A. F. Pedersen, et al.
  יצא לאור: (2020-07-01)
• Non-destructive analysis of micro texture and grain boundary character from X-ray diffraction contrast tomography
  מאת: King, A, et al.
  יצא לאור: (2010)