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X-ray diffraction contrast to...
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X-ray diffraction contrast tomography: a novel technique for three-dimensional grain mapping of polycrystals. I. Direct beam case
Detalles Bibliográficos
Main Authors:
Ludwig, W
,
Schmidt, S
,
Lauridsen, E
,
Poulsen, H
Formato:
Conference item
Publicado:
2008
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