Measurement of elastic strains and small lattice rotations using electron back scatter diffraction.

A method is presented for the determination of elastic strains from electron back scatter diffraction patterns, which are obtained at high spatial resolution, from bulk specimens in a scanning electron microscope. It is estimated that the method is sensitive to strains of the order of 0.02%. Strains...

पूर्ण विवरण

ग्रंथसूची विवरण
मुख्य लेखक: Wilkinson, A
स्वरूप: Journal article
भाषा:English
प्रकाशित: 1996