Measurement of elastic strains and small lattice rotations using electron back scatter diffraction.
A method is presented for the determination of elastic strains from electron back scatter diffraction patterns, which are obtained at high spatial resolution, from bulk specimens in a scanning electron microscope. It is estimated that the method is sensitive to strains of the order of 0.02%. Strains...
| Egile nagusia: | |
|---|---|
| Formatua: | Journal article |
| Hizkuntza: | English |
| Argitaratua: |
1996
|