Measurement of elastic strains and small lattice rotations using electron back scatter diffraction.
A method is presented for the determination of elastic strains from electron back scatter diffraction patterns, which are obtained at high spatial resolution, from bulk specimens in a scanning electron microscope. It is estimated that the method is sensitive to strains of the order of 0.02%. Strains...
المؤلف الرئيسي: | Wilkinson, A |
---|---|
التنسيق: | Journal article |
اللغة: | English |
منشور في: |
1996
|
مواد مشابهة
-
Assessment of lattice strain, rotation and dislocation content using electron back-scatter diffraction
حسب: Wilkinson, A
منشور في: (2011) -
Assessment of lattice strain, rotation and dislocation content using electron back-scatter diffraction
حسب: Wilkinson, A, وآخرون
منشور في: (2011) -
Strain measurement using electron back scatter diffraction
حسب: Wilkinson, A
منشور في: (1998) -
Measurement of residual elastic strain and lattice rotations with high resolution electron backscatter diffraction.
حسب: Britton, T, وآخرون
منشور في: (2011) -
Measurement of small misorientations using electron back scatter diffraction
حسب: Wilkinson, A
منشور في: (1999)