Measurement of elastic strains and small lattice rotations using electron back scatter diffraction.

A method is presented for the determination of elastic strains from electron back scatter diffraction patterns, which are obtained at high spatial resolution, from bulk specimens in a scanning electron microscope. It is estimated that the method is sensitive to strains of the order of 0.02%. Strains...

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Príomhchruthaitheoir: Wilkinson, A
Formáid: Journal article
Teanga:English
Foilsithe / Cruthaithe: 1996

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