Measurement of elastic strains and small lattice rotations using electron back scatter diffraction.

A method is presented for the determination of elastic strains from electron back scatter diffraction patterns, which are obtained at high spatial resolution, from bulk specimens in a scanning electron microscope. It is estimated that the method is sensitive to strains of the order of 0.02%. Strains...

תיאור מלא

מידע ביבליוגרפי
מחבר ראשי: Wilkinson, A
פורמט: Journal article
שפה:English
יצא לאור: 1996

פריטים דומים