$Measurement of elastic strains and small lattice rotations using electron back scatter diffraction.$

Measurement of elastic strains and small lattice rotations using electron back scatter diffraction.

A method is presented for the determination of elastic strains from electron back scatter diffraction patterns, which are obtained at high spatial resolution, from bulk specimens in a scanning electron microscope. It is estimated that the method is sensitive to strains of the order of 0.02%. Strains...

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Chi tiết về thư mục
Tác giả chính:	Wilkinson, A
Định dạng:	Journal article
Ngôn ngữ:	English
Được phát hành:	1996

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