Measurement of elastic strains and small lattice rotations using electron back scatter diffraction.
A method is presented for the determination of elastic strains from electron back scatter diffraction patterns, which are obtained at high spatial resolution, from bulk specimens in a scanning electron microscope. It is estimated that the method is sensitive to strains of the order of 0.02%. Strains...
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| Định dạng: | Journal article |
| Ngôn ngữ: | English |
| Được phát hành: |
1996
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