LATERAL AND DEPTH SCALE CALIBRATION OF THE POSITION-SENSITIVE ATOM-PROBE

Podobne zapisy

• RECENT DEVELOPMENTS IN POSITION-SENSITIVE ATOM-PROBE MICROANALYSIS
  od: Smith, G, i wsp.
  Wydane: (1994)
• Some recent advances in three dimensional atomic scale microanalysis with the atom probe (invited)
  od: Cerezo, A, i wsp.
  Wydane: (1994)
• POSITION-SENSITIVE ATOM-PROBE STUDY OF THE DECOMPOSITION OF A CU-2.6AT-PERCENT-CO ALLOY
  od: Setna, R, i wsp.
  Wydane: (1993)
• ULTRA-HIGH-RESOLUTION CHEMICAL-ANALYSIS BY FIELD-ION MICROSCOPY, ATOM PROBE AND POSITION-SENSITIVE ATOM-PROBE TECHNIQUES
  od: Grovenor, C, i wsp.
  Wydane: (1992)
• NEW DIMENSIONS IN ATOM-PROBE ANALYSIS
  od: Cerezo, A, i wsp.
  Wydane: (1992)