Skip to content
VuFind
English
Deutsch
Español
Français
Italiano
日本語
Nederlands
Português
Português (Brasil)
中文(简体)
中文(繁體)
Türkçe
עברית
Gaeilge
Cymraeg
Ελληνικά
Català
Euskara
Русский
Čeština
Suomi
Svenska
polski
Dansk
slovenščina
اللغة العربية
বাংলা
Galego
Tiếng Việt
Hrvatski
हिंदी
Հայերէն
Українська
Sámegiella
Монгол
Language
All Fields
Title
Author
Subject
Call Number
ISBN/ISSN
Tag
Find
Advanced
LATERAL AND DEPTH SCALE CALIBR...
Cite this
Text this
Email this
Print
Export Record
Export to RefWorks
Export to EndNoteWeb
Export to EndNote
Permanent link
LATERAL AND DEPTH SCALE CALIBRATION OF THE POSITION-SENSITIVE ATOM-PROBE
Bibliographic Details
Main Authors:
Hyde, J
,
Cerezo, A
,
Setna, R
,
Warren, P
,
Smith, G
Format:
Conference item
Published:
1994
Holdings
Description
Similar Items
Staff View
Similar Items
RECENT DEVELOPMENTS IN POSITION-SENSITIVE ATOM-PROBE MICROANALYSIS
by: Smith, G, et al.
Published: (1994)
POSITION-SENSITIVE ATOM-PROBE STUDY OF THE DECOMPOSITION OF A CU-2.6AT-PERCENT-CO ALLOY
by: Setna, R, et al.
Published: (1993)
Some recent advances in three dimensional atomic scale microanalysis with the atom probe (invited)
by: Cerezo, A, et al.
Published: (1994)
ULTRA-HIGH-RESOLUTION CHEMICAL-ANALYSIS BY FIELD-ION MICROSCOPY, ATOM PROBE AND POSITION-SENSITIVE ATOM-PROBE TECHNIQUES
by: Grovenor, C, et al.
Published: (1992)
STRUCTURAL-ANALYSIS WITH THE POSITION-SENSITIVE ATOM PROBE
by: Hetherington, M, et al.
Published: (1992)