Measurement of temperature rises in the femtosecond laser pulsed three-dimensional atom probe

Measurement of temperature rises in the femtosecond laser pulsed three-dimensional atom probe

Εμφάνιση άλλων εκδόσεων (1)

A previous Letter [B. Gault et al., Appl. Phys. Lett. 86, 094101 (2005)] interpreted measurements of the field evaporative enhancement under femtosecond pulsed laser irradiation of a field emitter in terms of a direct electric field enhancement by the intrinsic field of the laser light. We show that...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς:	Cerezo, A, Smith, G, Clifton, P
Μορφή:	Journal article
Γλώσσα:	English
Έκδοση:	American Institute of Physics 2006
Θέματα:	Materials Sciences Field Ion Microscopy

Παρόμοια τεκμήρια

Measurement of temperature rises in the femtosecond laser pulsed three-dimensional atom probe
ανά: Cerezo, A, κ.ά.
Έκδοση: (2006)

Aspects of the performance of a femtosecond laser-pulsed 3-dimensional atom probe.
ανά: Cerezo, A, κ.ά.
Έκδοση: (2007)

Atom Probe Microscopy /
ανά: Gault, Baptiste author 632642, κ.ά.
Έκδοση: (2012)

Atom probe tomography characterization of engineering ceramics
ανά: Singh, J
Έκδοση: (2021)

Study of early-stage precipitation in Al-Mg-Si(-Cu) alloys by 3D atom probe
ανά: Zandbergen, MW
Έκδοση: (2008)

Atomic-scale microscopy of different materials by ultrashort THz-driven Atom Probe Tomography
ανά: De Tullio Matteo, κ.ά.
Έκδοση: (2024-01-01)

THE EFFECT OF LASER-PULSE SHAPE ON MASS RESOLUTION IN THE PULSED-LASER ATOM PROBE
ανά: Cerezo, A, κ.ά.
Έκδοση: (1987)

Atom probe tomography of irradiated zirconium alloys
ανά: Callow, A
Έκδοση: (2021)

Generation of ultrashort keV Ar+ ion pulses via femtosecond laser photoionization
ανά: Alexander Golombek, κ.ά.
Έκδοση: (2021-01-01)

PULSED LASER ATOM PROBE ANALYSIS OF GAAS AND INAS
ανά: Cerezo, A, κ.ά.
Έκδοση: (1985)

PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
ανά: Cerezo, A, κ.ά.
Έκδοση: (1986)

Atom probe tomography analysis of Nb3Sn superconducting wires for fusion reactor and particle accelerator applications
ανά: Wheatley, L
Έκδοση: (2023)

PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
ανά: Grovenor, C, κ.ά.
Έκδοση: (1987)

Overview: Recent progress in three-dimensional atom probe instruments and applications
ανά: Cerezo, A, κ.ά.
Έκδοση: (2007)

Overview: recent progress in three-dimensional atom probe instruments and applications.
ανά: Cerezo, A, κ.ά.
Έκδοση: (2007)

Progress in the atomic-scale analysis of materials with the three-dimensional atom probe
ανά: Cerezo, A, κ.ά.
Έκδοση: (2001)

PULSED LASER ATOM PROBE ANALYSIS OF III-V COMPOUND SEMICONDUCTORS
ανά: Cerezo, A, κ.ά.
Έκδοση: (1986)

Improvements in the mass resolution of the three-dimensional atom probe
ανά: Sijbrandij, S, κ.ά.
Έκδοση: (1996)

Field ion microscopy : principles and applications /
ανά: 235718 Muller, Erwin W., κ.ά.
Έκδοση: (1969)

PULSED LASER ATOM PROBE CHARACTERIZATION OF SILICON-CARBIDE
ανά: Miller, M, κ.ά.
Έκδοση: (1989)

Performance of an energy-compensated three-dimensional atom probe
ανά: Cerezo, A, κ.ά.
Έκδοση: (1998)

Field desorption of sesium atoms from nanostructured rhenium surface
ανά: D.P. Bernatskii, κ.ά.
Έκδοση: (2017-12-01)

Three-dimensional atom probe studies of metallic multilayers
ανά: Larson, D, κ.ά.
Έκδοση: (1999)

Nanoscale characterization of compound semiconductors using laser-pulsed atom probe tomography
ανά: Muller, M, κ.ά.
Έκδοση: (2010)

Nanoscale characterization of compound semiconductors using laser-pulsed atom probe tomography
ανά: Müller, M, κ.ά.
Έκδοση: (2010)

Single femtosecond laser pulse–induced valence state conversion in BaFCl: Sm3+ nanocrystals for low-threshold optical storage
ανά: Zheng Biao, κ.ά.
Έκδοση: (2024-06-01)

Applications of a high-resolution three dimensional atom probe
ανά: Smith, G, κ.ά.
Έκδοση: (1997)

Field emission and related topics /
ανά: Tien, Tzou Tsong, κ.ά.
Έκδοση: (1978)

Some recent advances in three dimensional atomic scale microanalysis with the atom probe (invited)
ανά: Cerezo, A, κ.ά.
Έκδοση: (1994)

Femtosecond electron beam probe of ultrafast electronics
ανά: Mattes Maximilian, κ.ά.
Έκδοση: (2024-01-01)

IMPROVEMENTS IN THE TRANSMISSION OF VOLTAGE EVAPORATION PULSES IN THE ATOM-PROBE
ανά: Sijbrandij, S, κ.ά.
Έκδοση: (1995)

Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction
ανά: Mehmet Z. Baykara, κ.ά.
Έκδοση: (2012-09-01)

Improvement of multilayer analyses with a three-dimensional atom probe
ανά: Vurpillot, F, κ.ά.
Έκδοση: (2004)

Influence of surface migration on the spatial resolution of pulsed laser atom probe tomography
ανά: Gault, B, κ.ά.
Έκδοση: (2010)

Corrosion and hydrogen pickup mechanisms of zirconium alloys
ανά: Setiadinata, SB
Έκδοση: (2016)

Electron and microscopy and microanalysis ; principles and applications /
ανά: 184792 Murr, Lawrence E.
Έκδοση: (1982)

PULSED LASER ATOM PROBE ANALYSIS OF III-V COMPOUND SEMICONDUCTOR EPILAYERS
ανά: Mackenzie, R, κ.ά.
Έκδοση: (1990)

Atomic scale characterization of buried In(x)Ga(1-x)As quantum dots using pulsed laser atom probe tomography
ανά: Mueller, M, κ.ά.
Έκδοση: (2008)

Atomic scale studies of thermally aged pressure vessel steels
ανά: Styman, P, κ.ά.
Έκδοση: (2013)

Spectrum imaging and three-dimensional atom probe studies of fine particles in a vanadium micro-alloyed steel
ανά: Craven, A, κ.ά.
Έκδοση: (2008)