Measurement of temperature rises in the femtosecond laser pulsed three-dimensional atom probe

Measurement of temperature rises in the femtosecond laser pulsed three-dimensional atom probe

अन्य संस्करण दिखाएं (1)

A previous Letter [B. Gault et al., Appl. Phys. Lett. 86, 094101 (2005)] interpreted measurements of the field evaporative enhancement under femtosecond pulsed laser irradiation of a field emitter in terms of a direct electric field enhancement by the intrinsic field of the laser light. We show that...

पूर्ण विवरण

ग्रंथसूची विवरण
मुख्य लेखकों:	Cerezo, A, Smith, G, Clifton, P
स्वरूप:	Journal article
भाषा:	English
प्रकाशित:	American Institute of Physics 2006
विषय:	Materials Sciences Field Ion Microscopy

समान संसाधन

Measurement of temperature rises in the femtosecond laser pulsed three-dimensional atom probe
द्वारा: Cerezo, A, और अन्य
प्रकाशित: (2006)

Aspects of the performance of a femtosecond laser-pulsed 3-dimensional atom probe.
द्वारा: Cerezo, A, और अन्य
प्रकाशित: (2007)

Atom Probe Microscopy /
द्वारा: Gault, Baptiste author 632642, और अन्य
प्रकाशित: (2012)

Atom probe tomography characterization of engineering ceramics
द्वारा: Singh, J
प्रकाशित: (2021)

Study of early-stage precipitation in Al-Mg-Si(-Cu) alloys by 3D atom probe
द्वारा: Zandbergen, MW
प्रकाशित: (2008)

Atomic-scale microscopy of different materials by ultrashort THz-driven Atom Probe Tomography
द्वारा: De Tullio Matteo, और अन्य
प्रकाशित: (2024-01-01)

THE EFFECT OF LASER-PULSE SHAPE ON MASS RESOLUTION IN THE PULSED-LASER ATOM PROBE
द्वारा: Cerezo, A, और अन्य
प्रकाशित: (1987)

Atom probe tomography of irradiated zirconium alloys
द्वारा: Callow, A
प्रकाशित: (2021)

Generation of ultrashort keV Ar+ ion pulses via femtosecond laser photoionization
द्वारा: Alexander Golombek, और अन्य
प्रकाशित: (2021-01-01)

PULSED LASER ATOM PROBE ANALYSIS OF GAAS AND INAS
द्वारा: Cerezo, A, और अन्य
प्रकाशित: (1985)

PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
द्वारा: Cerezo, A, और अन्य
प्रकाशित: (1986)

Atom probe tomography analysis of Nb3Sn superconducting wires for fusion reactor and particle accelerator applications
द्वारा: Wheatley, L
प्रकाशित: (2023)

PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
द्वारा: Grovenor, C, और अन्य
प्रकाशित: (1987)

Overview: Recent progress in three-dimensional atom probe instruments and applications
द्वारा: Cerezo, A, और अन्य
प्रकाशित: (2007)

Overview: recent progress in three-dimensional atom probe instruments and applications.
द्वारा: Cerezo, A, और अन्य
प्रकाशित: (2007)

Progress in the atomic-scale analysis of materials with the three-dimensional atom probe
द्वारा: Cerezo, A, और अन्य
प्रकाशित: (2001)

PULSED LASER ATOM PROBE ANALYSIS OF III-V COMPOUND SEMICONDUCTORS
द्वारा: Cerezo, A, और अन्य
प्रकाशित: (1986)

Improvements in the mass resolution of the three-dimensional atom probe
द्वारा: Sijbrandij, S, और अन्य
प्रकाशित: (1996)

Field ion microscopy : principles and applications /
द्वारा: 235718 Muller, Erwin W., और अन्य
प्रकाशित: (1969)

PULSED LASER ATOM PROBE CHARACTERIZATION OF SILICON-CARBIDE
द्वारा: Miller, M, और अन्य
प्रकाशित: (1989)

Performance of an energy-compensated three-dimensional atom probe
द्वारा: Cerezo, A, और अन्य
प्रकाशित: (1998)

Field desorption of sesium atoms from nanostructured rhenium surface
द्वारा: D.P. Bernatskii, और अन्य
प्रकाशित: (2017-12-01)

Three-dimensional atom probe studies of metallic multilayers
द्वारा: Larson, D, और अन्य
प्रकाशित: (1999)

Nanoscale characterization of compound semiconductors using laser-pulsed atom probe tomography
द्वारा: Muller, M, और अन्य
प्रकाशित: (2010)

Nanoscale characterization of compound semiconductors using laser-pulsed atom probe tomography
द्वारा: Müller, M, और अन्य
प्रकाशित: (2010)

Single femtosecond laser pulse–induced valence state conversion in BaFCl: Sm3+ nanocrystals for low-threshold optical storage
द्वारा: Zheng Biao, और अन्य
प्रकाशित: (2024-06-01)

Applications of a high-resolution three dimensional atom probe
द्वारा: Smith, G, और अन्य
प्रकाशित: (1997)

Field emission and related topics /
द्वारा: Tien, Tzou Tsong, और अन्य
प्रकाशित: (1978)

Some recent advances in three dimensional atomic scale microanalysis with the atom probe (invited)
द्वारा: Cerezo, A, और अन्य
प्रकाशित: (1994)

Femtosecond electron beam probe of ultrafast electronics
द्वारा: Mattes Maximilian, और अन्य
प्रकाशित: (2024-01-01)

IMPROVEMENTS IN THE TRANSMISSION OF VOLTAGE EVAPORATION PULSES IN THE ATOM-PROBE
द्वारा: Sijbrandij, S, और अन्य
प्रकाशित: (1995)

Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction
द्वारा: Mehmet Z. Baykara, और अन्य
प्रकाशित: (2012-09-01)

Improvement of multilayer analyses with a three-dimensional atom probe
द्वारा: Vurpillot, F, और अन्य
प्रकाशित: (2004)

Influence of surface migration on the spatial resolution of pulsed laser atom probe tomography
द्वारा: Gault, B, और अन्य
प्रकाशित: (2010)

Corrosion and hydrogen pickup mechanisms of zirconium alloys
द्वारा: Setiadinata, SB
प्रकाशित: (2016)

Electron and microscopy and microanalysis ; principles and applications /
द्वारा: 184792 Murr, Lawrence E.
प्रकाशित: (1982)

PULSED LASER ATOM PROBE ANALYSIS OF III-V COMPOUND SEMICONDUCTOR EPILAYERS
द्वारा: Mackenzie, R, और अन्य
प्रकाशित: (1990)

Atomic scale characterization of buried In(x)Ga(1-x)As quantum dots using pulsed laser atom probe tomography
द्वारा: Mueller, M, और अन्य
प्रकाशित: (2008)

Atomic scale studies of thermally aged pressure vessel steels
द्वारा: Styman, P, और अन्य
प्रकाशित: (2013)

Spectrum imaging and three-dimensional atom probe studies of fine particles in a vanadium micro-alloyed steel
द्वारा: Craven, A, और अन्य
प्रकाशित: (2008)