Determination of Grain Orientations in Multicrystalline Silicon by Reflectometry

At present there is no quick and simple method to determine the type and orientation of grains in multicrystalline silicon, which is commonly used for photovoltaic applications. In this paper, a novel method for performing such measurements is described. A laser beam is reflected off an anisotropica...

Szczegółowa specyfikacja

Opis bibliograficzny
Główni autorzy: Wang, Y, Murphy, J, Wilshaw, P
Format: Journal article
Język:English
Wydane: 2010