APA aipamena

Wang, Y., Murphy, J., & Wilshaw, P. (2010). Determination of Grain Orientations in Multicrystalline Silicon by Reflectometry.

Chicago Style aipamena

Wang, Y., J. Murphy, and P. Wilshaw. Determination of Grain Orientations in Multicrystalline Silicon by Reflectometry. 2010.

MLA aipamena

Wang, Y., et al. Determination of Grain Orientations in Multicrystalline Silicon by Reflectometry. 2010.