APA način citiranja (7. izdanje)

Wang, Y., Murphy, J., & Wilshaw, P. (2010). Determination of Grain Orientations in Multicrystalline Silicon by Reflectometry.

Čikaški stil citiranja (17. izdanje)

Wang, Y., J. Murphy, i P. Wilshaw. Determination of Grain Orientations in Multicrystalline Silicon by Reflectometry. 2010.

MLA način citiranja (9. izdanje)

Wang, Y., et al. Determination of Grain Orientations in Multicrystalline Silicon by Reflectometry. 2010.