APA(7版)引用形式

Wang, Y., Murphy, J., & Wilshaw, P. (2010). Determination of Grain Orientations in Multicrystalline Silicon by Reflectometry.

Chicagoスタイル(17版)引用形式

Wang, Y., J. Murphy, , P. Wilshaw. Determination of Grain Orientations in Multicrystalline Silicon by Reflectometry. 2010.

MLA(9版)引用形式

Wang, Y., et al. Determination of Grain Orientations in Multicrystalline Silicon by Reflectometry. 2010.

警告: この引用は必ずしも正確ではありません.