$High resolution mapping of strains and rotations using electron backscatter diffraction$

High resolution mapping of strains and rotations using electron backscatter diffraction

عرض إصدارات أخرى (1)

<p style="text-align:justify;"> The angular resolution of electron backscatter diffraction (EBSD) measurements can be significantly improved using an analysis based on determination of small shifts in features from one pattern to the next using cross-correlation functions. Using pat...

وصف كامل

التفاصيل البيبلوغرافية
المؤلفون الرئيسيون:	Wilkinson, A, Meaden, G, Dingley, D
التنسيق:	Journal article
اللغة:	English
منشور في:	Taylor and Francis 2013

مواد مشابهة

High resolution mapping of strains and rotations using electron backscatter diffraction
حسب: Wilkinson, A, وآخرون
منشور في: (2006)

Strain mapping using electron backscatter diffraction
حسب: Wilkinson, A, وآخرون
منشور في: (2009)

High-resolution elastic strain measurement from electron backscatter diffraction patterns: new levels of sensitivity.
حسب: Wilkinson, A, وآخرون
منشور في: (2006)

Elastic strain tensor measurement using electron backscatter diffraction in the SEM.
حسب: Dingley, D, وآخرون
منشور في: (2010)

Mapping strains at the nanoscale using electron back scatter diffraction
حسب: Wilkinson, A, وآخرون
منشور في: (2009)

Strain tensor mapping at the nanoscale using electron back scatter diffraction
حسب: Wilkinson, A, وآخرون
منشور في: (2006)

Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns.
حسب: Britton, T, وآخرون
منشور في: (2010)

Measurement of residual elastic strain and lattice rotations with high resolution electron backscatter diffraction.
حسب: Britton, T, وآخرون
منشور في: (2011)

High resolution electron backscatter diffraction measurements of elastic strain variations in the presence of larger lattice rotations.
حسب: Britton, T, وآخرون
منشور في: (2012)

High resolution measurements of strain and tilt distributions in SiGe mesas using electron backscatter diffraction
حسب: Wilkinson, A
منشور في: (2006)

High resolution measurements of strain and tilt distributions in SiGe mesas using electron backscatter diffraction
حسب: Wilkinson, A
منشور في: (2006)

Strain mapping using high-resolution electron backscatter diffraction technique: The influence of sample preparation
حسب: Nowakowski Pawel, وآخرون
منشور في: (2024-01-01)

Analysis of dislocation densities using high resolution electron backscatter diffraction
حسب: Vilalta-Clemente, A, وآخرون
منشور في: (2015)

High-resolution electron backscatter diffraction in III-nitride semiconductors
حسب: Vilalta-Clemente, A, وآخرون
منشور في: (2015)

In situ characterisation of the strain fields of intragranular slip bands in ferrite by high-resolution electron backscatter diffraction
حسب: Koko, A, وآخرون
منشور في: (2022)

High-angular resolution electron backscatter diffraction as a new tool for mapping lattice distortion in geological minerals
حسب: Wallis, D, وآخرون
منشور في: (2019)

The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements.
حسب: Tong, V, وآخرون
منشور في: (2015)

High-resolution electron backscatter diffraction: an emerging tool for studying local deformation
حسب: Wilkinson, A, وآخرون
منشور في: (2010)

Measurement of plastic strain of polycrystalline material by electron backscatter diffraction
حسب: Kamaya, M, وآخرون
منشور في: (2005)

Adaptable physics-based super-resolution for electron backscatter diffraction maps
حسب: Devendra K. Jangid, وآخرون
منشور في: (2022-12-01)

Geometrically necessary dislocation densities in olivine obtained using high-angular resolution electron backscatter diffraction
حسب: Wallis, D, وآخرون
منشور في: (2016)

Methods for determining elastic strains from electron backscatter diffraction and electron channelling patterns
حسب: Wilkinson, A
منشور في: (1997)

An iterative method for reference pattern selection in high-resolution electron backscatter diffraction (HR-EBSD)
حسب: Koko, A, وآخرون
منشور في: (2023)

Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films
حسب: Wilkinson, A, وآخرون
منشور في: (2016)

Quantification of plastic strain of stainless steel and nickel alloy by electron backscatter diffraction
حسب: Kamaya, M, وآخرون
منشور في: (2006)

Probing deformation and revealing microstructural mechanisms with cross-correlation-based, high-resolution electron backscatter diffraction
حسب: Britton, T, وآخرون
منشور في: (2013)

Direct detection of electron backscatter diffraction patterns.
حسب: Wilkinson, A, وآخرون
منشور في: (2013)

Rapid electron backscatter diffraction mapping: painting by numbers
حسب: Tong, V, وآخرون
منشور في: (2018)

Assessing the precision of strain measurements using electron backscatter diffraction--part 1: detector assessment.
حسب: Britton, T, وآخرون
منشور في: (2013)

Assessing the precision of strain measurements using electron backscatter diffraction--part 2: experimental demonstration.
حسب: Britton, T, وآخرون
منشور في: (2013)

Assessing the precision of strain measurements using electron backscatter diffraction - part 1: Detector assessment
حسب: Britton, T, وآخرون
منشور في: (2013)

Assessing the precision of strain measurements using electron backscatter diffraction - Part 2: Experimental demonstration
حسب: Britton, T, وآخرون
منشور في: (2013)

The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements
حسب: Tong, V, وآخرون
منشور في: (2015)

Measurement of geometrically necessary dislocation density with high resolution electron backscatter diffraction: effects of detector binning and step size.
حسب: Jiang, J, وآخرون
منشور في: (2013)

High resolution electron backscatter diffraction study on the heterogeneities of tetragonal distortion in Fe-C martensite at the microstructural scale
حسب: Tanaka, T, وآخرون
منشور في: (2020)

J-integral analysis of the elastic strain fields of ferrite deformation twins using electron backscatter diffraction
حسب: Koko, A, وآخرون
منشور في: (2021)

A high resolution electron backscatter diffraction study of heterogeneous deformation in polycrystal copper
حسب: Jiang, J
منشور في: (2013)

Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction
حسب: Naresh-Kumar, G, وآخرون
منشور في: (2017)

Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction
حسب: G. Naresh-Kumar, وآخرون
منشور في: (2017-09-01)

Electron backscatter diffraction in the silicon nanowires
حسب: K.K. Dikhanbayev, وآخرون
منشور في: (2016-10-01)