$High resolution mapping of strains and rotations using electron backscatter diffraction$

High resolution mapping of strains and rotations using electron backscatter diffraction

Εμφάνιση άλλων εκδόσεων (1)

<p style="text-align:justify;"> The angular resolution of electron backscatter diffraction (EBSD) measurements can be significantly improved using an analysis based on determination of small shifts in features from one pattern to the next using cross-correlation functions. Using pat...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς:	Wilkinson, A, Meaden, G, Dingley, D
Μορφή:	Journal article
Γλώσσα:	English
Έκδοση:	Taylor and Francis 2013

Παρόμοια τεκμήρια

High resolution mapping of strains and rotations using electron backscatter diffraction
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Strain mapping using electron backscatter diffraction
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High-resolution elastic strain measurement from electron backscatter diffraction patterns: new levels of sensitivity.
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Elastic strain tensor measurement using electron backscatter diffraction in the SEM.
ανά: Dingley, D, κ.ά.
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Mapping strains at the nanoscale using electron back scatter diffraction
ανά: Wilkinson, A, κ.ά.
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Strain tensor mapping at the nanoscale using electron back scatter diffraction
ανά: Wilkinson, A, κ.ά.
Έκδοση: (2006)

Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns.
ανά: Britton, T, κ.ά.
Έκδοση: (2010)

Measurement of residual elastic strain and lattice rotations with high resolution electron backscatter diffraction.
ανά: Britton, T, κ.ά.
Έκδοση: (2011)

High resolution electron backscatter diffraction measurements of elastic strain variations in the presence of larger lattice rotations.
ανά: Britton, T, κ.ά.
Έκδοση: (2012)

High resolution measurements of strain and tilt distributions in SiGe mesas using electron backscatter diffraction
ανά: Wilkinson, A
Έκδοση: (2006)

High resolution measurements of strain and tilt distributions in SiGe mesas using electron backscatter diffraction
ανά: Wilkinson, A
Έκδοση: (2006)

Strain mapping using high-resolution electron backscatter diffraction technique: The influence of sample preparation
ανά: Nowakowski Pawel, κ.ά.
Έκδοση: (2024-01-01)

Analysis of dislocation densities using high resolution electron backscatter diffraction
ανά: Vilalta-Clemente, A, κ.ά.
Έκδοση: (2015)

High-resolution electron backscatter diffraction in III-nitride semiconductors
ανά: Vilalta-Clemente, A, κ.ά.
Έκδοση: (2015)

In situ characterisation of the strain fields of intragranular slip bands in ferrite by high-resolution electron backscatter diffraction
ανά: Koko, A, κ.ά.
Έκδοση: (2022)

High-angular resolution electron backscatter diffraction as a new tool for mapping lattice distortion in geological minerals
ανά: Wallis, D, κ.ά.
Έκδοση: (2019)

The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements.
ανά: Tong, V, κ.ά.
Έκδοση: (2015)

High-resolution electron backscatter diffraction: an emerging tool for studying local deformation
ανά: Wilkinson, A, κ.ά.
Έκδοση: (2010)

Measurement of plastic strain of polycrystalline material by electron backscatter diffraction
ανά: Kamaya, M, κ.ά.
Έκδοση: (2005)

Adaptable physics-based super-resolution for electron backscatter diffraction maps
ανά: Devendra K. Jangid, κ.ά.
Έκδοση: (2022-12-01)

Geometrically necessary dislocation densities in olivine obtained using high-angular resolution electron backscatter diffraction
ανά: Wallis, D, κ.ά.
Έκδοση: (2016)

Methods for determining elastic strains from electron backscatter diffraction and electron channelling patterns
ανά: Wilkinson, A
Έκδοση: (1997)

An iterative method for reference pattern selection in high-resolution electron backscatter diffraction (HR-EBSD)
ανά: Koko, A, κ.ά.
Έκδοση: (2023)

Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films
ανά: Wilkinson, A, κ.ά.
Έκδοση: (2016)

Quantification of plastic strain of stainless steel and nickel alloy by electron backscatter diffraction
ανά: Kamaya, M, κ.ά.
Έκδοση: (2006)

Probing deformation and revealing microstructural mechanisms with cross-correlation-based, high-resolution electron backscatter diffraction
ανά: Britton, T, κ.ά.
Έκδοση: (2013)

Direct detection of electron backscatter diffraction patterns.
ανά: Wilkinson, A, κ.ά.
Έκδοση: (2013)

Rapid electron backscatter diffraction mapping: painting by numbers
ανά: Tong, V, κ.ά.
Έκδοση: (2018)

Assessing the precision of strain measurements using electron backscatter diffraction--part 1: detector assessment.
ανά: Britton, T, κ.ά.
Έκδοση: (2013)

Assessing the precision of strain measurements using electron backscatter diffraction--part 2: experimental demonstration.
ανά: Britton, T, κ.ά.
Έκδοση: (2013)

Assessing the precision of strain measurements using electron backscatter diffraction - part 1: Detector assessment
ανά: Britton, T, κ.ά.
Έκδοση: (2013)

Assessing the precision of strain measurements using electron backscatter diffraction - Part 2: Experimental demonstration
ανά: Britton, T, κ.ά.
Έκδοση: (2013)

The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements
ανά: Tong, V, κ.ά.
Έκδοση: (2015)

Measurement of geometrically necessary dislocation density with high resolution electron backscatter diffraction: effects of detector binning and step size.
ανά: Jiang, J, κ.ά.
Έκδοση: (2013)

High resolution electron backscatter diffraction study on the heterogeneities of tetragonal distortion in Fe-C martensite at the microstructural scale
ανά: Tanaka, T, κ.ά.
Έκδοση: (2020)

J-integral analysis of the elastic strain fields of ferrite deformation twins using electron backscatter diffraction
ανά: Koko, A, κ.ά.
Έκδοση: (2021)

A high resolution electron backscatter diffraction study of heterogeneous deformation in polycrystal copper
ανά: Jiang, J
Έκδοση: (2013)

Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction
ανά: Naresh-Kumar, G, κ.ά.
Έκδοση: (2017)

Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction
ανά: G. Naresh-Kumar, κ.ά.
Έκδοση: (2017-09-01)

Electron backscatter diffraction in the silicon nanowires
ανά: K.K. Dikhanbayev, κ.ά.
Έκδοση: (2016-10-01)