High resolution mapping of strains and rotations using electron backscatter diffraction
<p style="text-align:justify;"> The angular resolution of electron backscatter diffraction (EBSD) measurements can be significantly improved using an analysis based on determination of small shifts in features from one pattern to the next using cross-correlation functions. Using pat...
| 主要な著者: | , , |
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| フォーマット: | Journal article |
| 言語: | English |
| 出版事項: |
Taylor and Francis
2013
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