Contrast in atomically resolved EF-SCEM imaging
Energy-filtered scanning confocal electron microscopy (EF-SCEM) is a technique that uses the reduced depth of field of an aberration-corrected transmission electron microscope to provide three-dimensional (3D) compositional information. Using a silicon sample in the <110> orientation,...
मुख्य लेखकों: | Wang, P, D'Alfonso, A, Hashimoto, A, Morgan, A, Takeguchi, M, Mitsuishi, K, Shimojo, M, Kirkland, A, Allen, L, Nellist, P |
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स्वरूप: | Journal article |
भाषा: | English |
प्रकाशित: |
2013
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समान संसाधन
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Contrast in atomically resolved EF-SCEM imaging.
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Prospects for 3D characterization of materials by aberration-corrected STEM and SCEM
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Three-dimensional analysis of nanoparticles on carbon support using aberration-corrected scanning confocal electron microscopy
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प्रकाशित: (2012) -
Bright-field scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope.
द्वारा: Wang, P, और अन्य
प्रकाशित: (2011) -
Nanoscale energy-filtered scanning confocal electron microscopy using a double-aberration-corrected transmission electron microscope.
द्वारा: Wang, P, और अन्य
प्रकाशित: (2010)