Contrast in atomically resolved EF-SCEM imaging
Energy-filtered scanning confocal electron microscopy (EF-SCEM) is a technique that uses the reduced depth of field of an aberration-corrected transmission electron microscope to provide three-dimensional (3D) compositional information. Using a silicon sample in the <110> orientation,...
| Main Authors: | , , , , , , , , , |
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| פורמט: | Journal article |
| שפה: | English |
| יצא לאור: |
2013
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