Dependence of carrier localization in InGaN/GaN multiple-quantum wells on well thickness

Carrier localization in InGaN/GaN multiple-quantum wells (MQWs) with three different well thicknesses was investigated optically using time-integrated and time-resolved microphotoluminescence spectroscopy. An anomalous temperature dependence of the photoluminescence peak energy was observed, as a co...

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מידע ביבליוגרפי
Main Authors: Na, J, Taylor, R, Lee, K, Wang, T, Tahraoui, A, Fox, A, Yi, S, Park, Y, Choi, J, Lee, J
פורמט: Journal article
שפה:English
יצא לאור: American Institute of Physics 2006
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