Optical emission spectroscopy of various materials irradiated by soft x-ray free-electron laser

The beam of the Free-Electron Laser in Hamburg (FLASH) was focused by a grazing incidence elliptical mirror (32.5 nm and 13.5 nm) and an off-axis parabolic mirror coated with a Si/Mo multilayer (13.5 nm) to 20-micron and 1-micron spot, respectively. The grazing incidence and normal incidence focusin...

Full description

Bibliographic Details
Main Authors:	Cihelka, J, Juha, L, Chalupský, J, Rosmej, F, Renner, O, Saksl, K, Hájková, V, Vyšín, L, Galtier, E, Schott, R, Khorsand, A, Riley, D, Dzelzainis, T, Nelson, A, Lee, R, Heimann, P, Nagler, B, Vinko, S, Wark, J, Whitcher, T, Toleikis, S, Tschentscher, T, Fäustlin, R, Wabnitz, H, Bajt, S
Format:	Journal article
Language:	English
Published:	2009

Optical emission spectroscopy of various materials irradiated by soft x-ray free-electron laser

Similar Items