Scanning near-field optical spectroscopy of buried semiconductor heterostructures

We present the first low-temperature scanning near-field optical microscopy cross-section images of v-groove quantum wire structures. Images with a resolution of similar to 200 nm are obtained and spatial mapping of the photoluminescence provides direct identification of the spectral features.

Detalhes bibliográficos
Principais autores: Hauert, M, Roshan, R, Maciel, A, Kim, J, Ryan, J, Schwarz, A, Kaluza, A, Schapers, T, Luth, H
Formato: Conference item
Publicado em: 2001