Synchrotron based reciprocal space mapping and dislocation substructure analysis
During plastic deformation of FCC materials, dislocation density does not evolve uniformly but a dislocation cell/wall structure is formed. X-ray diffraction reciprocal space mapping is used to investigate this substructure within a single grain in a large grained aluminium polycrystal. A simple dis...
| Hlavní autoři: | , , , , |
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| Médium: | Journal article |
| Jazyk: | English |
| Vydáno: |
2009
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