CHEMICAL MICROANALYSIS OF SEMICONDUCTOR HETEROSTRUCTURES BY THICKNESS FRINGE IMAGING

Míreanna comhchosúla

• DISLOCATION GEOMETRIES IN SEMICONDUCTORS AND IN SEMICONDUCTOR HETEROSTRUCTURES
  de réir: Cockayne, D, et al.
  Foilsithe / Cruthaithe: (1991)
• LATTICE FRINGE IMAGING OF MODULATED STRUCTURES
  de réir: Cockayne, D, et al.
  Foilsithe / Cruthaithe: (1981)
• RECENT DEVELOPMENTS IN THE STUDY OF SEMICONDUCTORS BY ATOM PROBE MICROANALYSIS.
  de réir: Grovenor, C, et al.
  Foilsithe / Cruthaithe: (1985)
• Limitations on the s-state approach to the interpretation of sub-angstrom resolution electron microscope images and microanalysis.
  de réir: Anstis, G, et al.
  Foilsithe / Cruthaithe: (2003)
• CRITICAL THICKNESS DETERMINATION OF INXGA1-XAS/GAAS STRAINED-LAYER SYSTEM BY TRANSMISSION ELECTRON-MICROSCOPY
  de réir: Zou, J, et al.
  Foilsithe / Cruthaithe: (1991)